首页> 外文OA文献 >Erratum: A study of (111) oriented epitaxial thin films of In 2O3 on cubic Y-doped ZrO2 by synchrotron based x-ray diffraction (Journal of Materials Research (2012) 27 (2257-2264) DOI: 10.1557/jmr.2012.162)

【2h】

Erratum: A study of (111) oriented epitaxial thin films of In 2O3 on cubic Y-doped ZrO2 by synchrotron based x-ray diffraction (Journal of Materials Research (2012) 27 (2257-2264) DOI: 10.1557/jmr.2012.162)

机译：勘误：基于同步加速器的X射线衍射研究立方Y掺杂ZrO2上In 2O3的（111）取向外延薄膜（材料研究杂志（2012）27（2257-2264）DOI：10.1557 / jmr.2012.162）

代理获取

本网站仅为用户提供外文OA文献查询和代理获取服务，本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文，但由于OA文献来源多样且变更频繁，仍可能出现获取不到、文献不完整或与标题不符等情况，如果获取不到我们将提供退款服务。请知悉。

页面导航

著录项
引文网络
相似文献
相关主题

著录项

作者
Regoutz, A; Zhang, KHL; Egdell, RG; Wermeille, D; Cowley, RA;
展开▼
作者单位

展开▼
年度 2012
总页数
原文格式 PDF
正文语种 eng
中图分类

相似文献

外文文献
中文文献

1. A study of (111) oriented epitaxial thin films of In_2O_3 on cubic Y-doped ZrO_2 by synchrotron-based x-ray diffraction [J] . Anna Regoutz, Kelvin H.L. Zhang, Russell G. Egdell, Journal of Materials Research . 2012,第17期

机译：基于同步加速器的x射线衍射研究立方Y掺杂ZrO_2上In_2O_3的（111）取向外延薄膜
2. Determination of the Poisson ratio of (001) and (111) oriented thin films of In_2O_3 by synchrotron-based x-ray diffraction [J] . K. H. L. Zhang, A. Regoutz, R. G. Palgrave, Physical review . 2011,第23期

机译：基于同步加速器的x射线衍射法测定In_2O_3的（001）和（111）取向薄膜的泊松比
3. Temperature-Dependent Reduction of Epitaxial Ce_(1-x)Pr_xO_(2-δ) (x =0-1) Thin Films on Si(111): A Combined Temperature-Programmed Desorption, X-ray Diffraction, X-ray Photoelectron Spectroscopy, and Raman Study [J] . Marvin Hartwig Zoellner, Gang Niu, Jin-Hao Jhang The journal of physical chemistry, C. Nanomaterials and interfaces . 2013,第47期

机译：Si（111）上外延Ce_（1-x）Pr_xO_（2-δ）（x = 0-1）薄膜的温度依赖性还原：程序升温解吸，X射线衍射，X射线光电子能谱和拉曼研究
4. Early yielding and stress recovery in (111) and (100) texture components in Cu thin films determined using synchrotron x-ray diffraction [C] . D.E. Nowak, S.P. Baker Symposium on Thin Films - Stresses and Mechanical Properties X; 20031201-20031205; Boston,MA; US . 2003

机译：使用同步加速器X射线衍射测定的Cu薄膜中（111）和（100）织构成分的早期屈服和应力恢复
5. Growth and structure of ultra-thin epitaxial chromium and iron oxide films on silver(001) and silver(111): A comprehensive study accomplished by x-ray photoelectron diffraction and low energy electron diffraction. [D] . Ozturk, Osman. 2002

机译：银（001）和银（111）上超薄外延铬和氧化铁膜的生长和结构：通过X射线光电子衍射和低能电子衍射完成的综合研究。
6. Erratum: Following the molecular motion of near-resonant excited CO on Pt(111): A simulated x-ray photoelectron diffraction study based on molecular dynamics calculations Struct. Dyn. 2 035102 (2015) [O] . Michael Greif, Tibor Nagy, Maksym Soloviov, 2016

机译：勘误表：跟随Pt（111）上近共振激发CO的分子运动：基于分子动力学计算的模拟X射线光电子衍射研究结构。达因2035102（2015）
7. Determination of the Poisson ratio of (001) and (111) oriented thin films of In2O3 by synchrotron-based x-ray diffraction [O] . Zhang, KHL, Regoutz, A, Palgrave, RG, 2011

机译：基于同步加速器的X射线衍射测定In2O3（001）和（111）取向薄膜的泊松比

Erratum: A study of (111) oriented epitaxial thin films of In 2O3 on cubic Y-doped ZrO2 by synchrotron based x-ray diffraction (Journal of Materials Research (2012) 27 (2257-2264) DOI: 10.1557/jmr.2012.162)

著录项

引文网络

相似文献

相关主题

期刊订阅